4사분면 양극 전압 변동 시뮬레이터
사용자 설명서
적용 할 수있는 LISUN models: LIS-APS-40100K300、LIS-APS-4010K300、LIS-APS-40150K300、LIS-APS-40200K300、LIS-APS-4020K300、LIS-APS-40300K300、LIS-APS-4030K300、LIS-APS-4050K300、LIS-APS-4070K300、LIS-APS-80100K300、LIS-APS-8010K300、LIS-APS-80150K300、LIS-APS-80200K300、LIS-APS-8020K300、LIS-APS-80300K300、LIS-APS-8030K300、LIS-APS-8050K300、LIS-APS-8070K300
1. 장비에 대한 기본 이해
1.1 모델 분류
| LISUN 모델 | LIS-APS-4010K300 | LIS-APS-4030K300 | LIS-APS-8050K300 | LIS-APS-80100K300 |
|---|---|---|---|---|
| 출력 특성 | Four-Quadrant Bipolar | |||
| Rated Output Voltage Un | ±40 V DC/AC | ±80 V DC/AC | ||
| Rated Output Current In | 0 to ±10 A | 0 to ±30 A | 0 to ±50 A | 0 to ±100 A |
| Transient peak current Ip | 2 times the rated current, duration 20–200 ms | |||
| Frequency Range (Sine Wave) | DC–300 kHz (output error < 0.1%) | |||
| 출력 모드 | Constant voltage, constant current. (Output accuracy: 0.05%; Setting accuracy: 1 mV/1 mA) | |||
| 전압 상승률 | ≥15V/µs | |||
| 교류 전압 진폭 | >30 Vpp @ 100 kHz; >10 Vpp @ 300 kHz | |||
| 적재량 | At full AC load, VPP drops by <200 mV | |||
| 주파수 출력 방식 | Fixed, Linear, Logarithmic | |||
| 소스 임피던스 | Adjustable from 0 mΩ to 500 mΩ (resolution: 1 mΩ, accuracy: <±5%). Also supports external resistance to meet specific automotive manufacturer standards. | |||
| 전압 리플 | <10 mVrms (ripple and noise: <30 mVpp) | |||
| 결합 파형 편집 | ISO 7637-2 P2b and P4 / Linear / DC / Sine wave / Square wave / Triangle wave / Exponential wave / Arbitrary waveform; supports frequency sweeping | |||
| Number of Editable Steps for Combined Waves | 최대 500걸음 | |||
| Minimum editable time for composite waves | 5 μs | |||
| Count the points on an arbitrary waveform | ≤ 16000,000 | |||
| Editable point spacing for arbitrary waves | 0.1마이크로초~1초 | |||
| 임의 파동 형식 | 엑셀, CSV | |||
| 보호 기능 | Features overcurrent, overvoltage, short-circuit, and overtemperature 보호 | |||
| 제어 시스템 | 10.1 인치 Chinese-English Android Capacitive Touchscreen Display + Supports Remote Control via PC Software | |||
| 리플 FFT 샘플링 분석 | The built-in oscilloscope displays the output waveform in real time. | |||
| 리플 중첩 폐쇄 루프 샘플링 | Equipped with built-in ripple voltage and current probes, it enables direct closed-loop ripple testing at a distance of 10 cm in accordance with ISO 16750-2:2023, Figure 5. | |||
1.2 적용 기준
| 표준 번호 | 표준 제목 |
|---|---|
| GB / T 28046.2-2019 | Environmental Conditions and Tests for Electrical and Electronic Equipment in Road Vehicles—Part 2: Electrical Loads |
| GB / T 21437.2-2021 | Test Methods for Electromagnetic Disturbances Caused by Conduction and Coupling in Electrical and Electronic Components of Road Vehicles—Part 2: Conducted Transient Emissions and Immunity Along Power Lines |
| SMTPC 38000001-2012 | General Testing Requirements for Automotive Electronic and Electrical Components |
| ISO 16750-2 : 2023 | Road Vehicles—Environmental Conditions and Testing for Electrical and Electronic Equipment—Part 2: Electrical Loads |
| ISO 7637-2 :2021 | Road Vehicles—Electrical Disturbances from Conduction and Coupling—Part 2: Electrical Transients Conducted Solely Along Power Supply Lines |
| 레벨 124 | Electrical and Electronic Components in Motor Vehicles Weighing Up to 3.5 Metric Tons—Requirements, Test Conditions, and Tests for the 12-Volt On-Board Electrical System |
| LV 148-E09 | 자동차의 전기 및 전자 부품 - 48V 온보드 전기 시스템 요구 사항 및 테스트 조건 |
| 폭스바겐 80000:2023 | Geometric Tolerance and Quality Control Specifications for Automotive Components |
| GS 95024-2:2011 | Electrical and Electronic Components in Motor Vehicles—Supplementary Requirements and Tests for 12V On-Board Electrical System Components |
| GMW 3172:2023 | General Specifications for Electrical and Electronic Components – Environmental and Durability |
1.3 응용 프로그램 시나리오
The LIS-APS Series Four-Quadrant Bipolar Voltage Variation Simulator is a high-precision power supply simulation device that supports bidirectional energy flow. Based on a fully controlled H-bridge topology, it enables disturbance-free transitions across all four operating quadrants and provides seamless switching between positive and negative voltage and current outputs.accurately simulating dynamic voltage changes, transient pulses, polarity reversals, and operating conditions such as open circuits, short circuits, and wire disconnections. It also features customizable waveform editing, adjustable impedance, and wide-frequency ripple superposition, making it a core piece of equipment for power supply adaptability testing in fields such as automotive electronics and rail transit.
Applications: In the automotive electronics sector, it simulates operating conditions such as fluctuations in vehicle battery voltage, start-stop cycles, and open circuits or short circuits in wiring harnesses to verify the immunity and reliability of components such as ECUs, BMSs, and vehicle lights; in the rail transit and aerospace sectors, it performs power supply adaptability testing on onboard electronic equipment; in industrial control and medical electronics, to verify the operational stability of equipment under power supply fluctuations; and in energy storage and motor applications, to simulate voltage and current characteristics during energy regeneration.
2. 사용상의 주의
2.1 환경 요구 사항
주변 온도: 23°C ± 5°C; 상대 습도: 45~75%(비응축); 고도: 2000m 이하; 주변에 강한 진동이나 전자기 간섭이 없어야 함; 먼지가 많거나, 가연성 물질이 있거나, 폭발성 물질이 있는 환경에서의 장비 사용은 엄격히 금지됩니다.
2.2 전원 공급 장치 요구 사항
Input power supply: AC 220 V ±10%, 50 Hz; Input power: ≤1 kW; The power supply must be reliably grounded, with a grounding resistance of ≤4 Ω; It is recommended to use a voltage-regulated power supply to prevent power grid fluctuations from affecting test accuracy.
2.3 배선 원리
Use power cables with the specified wire gauge to prevent the conductors from overheating under high current conditions; keep test cables as short as possible and route them in parallel to minimize the impact of parasitic parameters; ensure that the DUT (Device Under Test) enclosure is reliably connected to the equipment’s protective ground; and route signal cables separately from power cables to avoid cross-interference.
2.4 운영 안전 지침
Wear insulated protective gear; before testing, ensure all connections are secure and that there are no exposed conductors; do not plug in or unplug test cables during testing to avoid arc burns; do not touch the DUT or test fixtures while the pulse is being output; if you hear unusual noises, smell an unusual odor, or see smoke, immediately disconnect the power; During prolonged continuous testing, ensure the equipment is properly ventilated for heat dissipation.
3. 장비 개요 및 배선
3.1 전면 패널
그림 3-1를 참조하세요.
| 번호 | 주의 사항 |
|---|---|
| ① | 기기 전원 스위치: 짧게 누르면 켜지고, 길게 누르면 꺼집니다. |
| ② | 10.1인치 정전식 터치스크린 |
| ③ | USB1 포트: 사용 대상 LISUN 엔지니어들이 장치 디버깅을 위해 사용하는 기능이며, 사용자들은 사용할 필요가 없습니다. |
| ④ | USB 2.0 포트는 마우스를 연결하여 터치스크린을 제어하거나, USB 플래시 드라이브를 연결하여 소프트웨어를 업그레이드하거나 데이터베이스 파일을 업데이트하는 데 사용할 수 있습니다. |
| ⑤ | Output connector; observe polarity. Used to connect directly to the DUT for testing. |

3.2 후면 패널
그림 3-2를 참조하세요.
| 번호 | 주의 사항 |
|---|---|
| ① | 전원 코드 소켓 및 퓨즈; 입력 전원 공급 장치가 제대로 접지되었는지 확인하십시오. |
| ② | Circuit breaker, main input power supply switch for the equipment |
| ③ | 보호 접지 단자: 입력 전원 공급 장치에 안정적인 접지 연결이 없는 경우, 이 단자를 별도로 접지에 연결해야 합니다. |
| ④ | Output jack—pay attention to polarity; this jack functions identically to the front-panel output jack. When using it as a power source, connect it to other devices using a cable. |
| ⑤ | RS485 interface/LAN port, which can be connected to a computer to use the host software (as a backup). The host software offers the same functionality as the touchscreen; please contact us if needed. |

3.3 액세서리 소개
그림 3-3를 참조하세요.
| 번호 | 주의 사항 |
|---|---|
| ① | 전원 코드 |
| ② | AC Output Voltage Calibration Cable, Spare. When outputting high-frequency AC voltage, if you observe that the output voltage attenuates over time, use this cable to calibrate the voltage. Please contact us if you need to use it. |
| ③ | 접지선 |
| ④ | Test lead, used to connect the output port on the device’s front panel to the DUT |
| ⑤ | 이더넷 케이블은 컴퓨터를 호스트 소프트웨어에 연결하는 데 사용됩니다. |

4. 터치스크린 프로그램 소개
4.1 테스트 인터페이스
4.1.1 Use as a Power Source
그림 4-1를 참조하세요.
| 번호 | 주의 사항 |
|---|---|
| ① | Set the output mode for DC: CV for constant voltage, CC for constant current |
| ② | Set the Output Resistance |
| ③ | Set DC Output Voltage/Current |
| ④ | Click to turn the DC power output on or off; it can be used as a standalone output or combined with AC output. |
| ⑤ | Select an AC Waveform |
| ⑥ | Set the AC Frequency |
| ⑦ | Set the AC voltage; note that this is the Vpp value. |
| ⑧ | Click to turn the AC power output on or off; it can be output independently or combined with DC output. |
| ⑨ | Switch to Manual Adjustment |
| ⑩ | Select the regulated power supply: AC or DC |
| ⑪ | Set the step value |
| ⑫ | Click the up/down buttons to manually adjust the output according to the set increment value. |
| ⑬ | Display the current output waveform |
| ⑭ | Screenshot: Click to save a screenshot of the current output waveform to your device. |

4.1.2 Standard Operational Testing
그림 4-2를 참조하세요.
| 번호 | 주의 사항 |
|---|---|
| ① | Here are the shortcut keys for the Pulse 2b and Pulse 4 waveforms in 12V mode. Simply click to select them—no need to adjust any parameters. |
| ② | If you need to use the Pulse 2b and Pulse 4 waveforms in 24V mode or conduct tests according to other standard specifications, you must access the database file interface to make your selection. Once selected, no parameters need to be modified. |
| ③ | Switch to Programming Mode |
| ④ | Click to run the test |
| ⑤ | Display the steps and duration of the current test |
| ⑥ | Display the current output waveform |

If you need to perform custom tests, refer to the table below.
| 번호 | 주의 사항 |
|---|---|
| a | Waveform selection, from top to bottom: DC linear wave, AC sine wave/triangular wave/TMW pulse wave, AC test mode (constant voltage), AC closed-loop test/constant current, AC open-loop test mode, differential wave, exponential wave, square wave, decay wave, custom waveform (reserved; please contact us if you need to use this option) |
| b | Waveform Diagram and Parameter Settings |
| c | After selecting a waveform and configuring the parameters, click “Add.” |
| d | Once all settings are configured, click “Save” to save the current test parameters to the database file. |
| e | All waveforms added in sequence |
4.2 데이터베이스 파일 인터페이스
그림 4-3를 참조하세요.
| 번호 | 주의 사항 |
|---|---|
| ① | Back to the Previous Directory |
| ② | Select the standard file you want to test |
| ③ | Double-click or click “Import” to open the test interface and run the test. |
| ④ | If you have other standard tests but do not wish to create custom tests, please contact us and send us the details of the corresponding standard. We will guide you on how to use a USB drive to update the database file directly with that standard. |

4.3 설정 인터페이스
그림 4-4를 참조하세요.
| 번호 | 주의 사항 |
|---|---|
| ① | Report Storage Methods and Paths |
| ② | Closed-Loop Test Save Options and Save Paths |
| ③ | How to Save Screenshots and Where They Are Saved |
| ④ | Communication settings are set to LOCAL by default. If you need to use host computer software, you can switch to RS485 or the LAN port. Please contact us. |
| ⑤ | Security settings: Use the factory default settings; do not change them. |
| ⑥ | Test Report Parameter Settings |
| ⑦ | Probe Multiplier: This setting is only effective during AC closed-loop testing. The value set for Vpp is multiplied by this multiplier. Use the factory default setting; do not modify it. |
| ⑧ | 볼륨 설정 |
| ⑨ | Combined Wave Compensation Voltage: If a compensation voltage is set here when outputting a combined waveform on the test interface, this value will be added. Use the factory default setting; do not modify it. |
| ⑩ | For overcurrent delay, use the factory default setting; do not modify it. |
| ⑪ | 표시 언어 전환 |

Note: We do not recommend enabling the auto-save feature. Automatically saving large numbers of waveform and report files over time will consume device storage space and may cause the touchscreen program to run slowly.
5. 테스트 절차
5.1 Using It as a Power Source
Ensure that all devices are powered off; use a test cable to connect the device’s output port to the DUT’s power input port; after setting the desired power output parameters as described in Section 4.1.1, start the output; when finished, click “Disconnect Output” again.
5.2 Standard Operational Testing
5.2.1 배선
Ensure that both the device and the DUT are powered off; use a test cable to connect the device’s output port to the DUT’s power cord.
5.2.2 운영 테스트
First, refer to Section 4.1.1 to set the appropriate power supply parameters for the DUT and enable the power supply output, ensuring that the DUT is in normal operating condition.
Then, refer to Section 4.1.2 to select the required test standard or configure the test parameters, and run the test; observe the DUT’s operating status and record any observations; wait for the test to complete—or, in case of an emergency, press the stop button to halt the test immediately.
5.2.3 Evaluation of Results
| 기능적 수준 | Definition of Standards | Judging Guidelines |
|---|---|---|
| A 급 | During and after the application of interference, all functions of the DUT operated normally as designed, and performance parameters remained within specifications. | No functional abnormalities were observed throughout the entire process, and no intervention was required after testing—this meets the highest standards. |
| B 급 | During the application of interference, all functions remain operational, but certain parameters may exceed their tolerance limits; once the interference is removed, all functions automatically return to their normal ranges, and the storage function maintains Class A performance. | Parameter drift and minor performance degradation are permitted during testing, but no functional failures may occur; the system must automatically recover after testing. |
| C 등급 | During the application of interference, one or more functions do not operate as designed; once the interference is removed, the functions automatically return to normal. | During testing, phenomena such as functional interruptions and logical anomalies are permitted; after testing, the system should recover automatically without the need for manual intervention. |
| 학년 D | Malfunction occurs while interference is present; after the interference is removed, normal operation can be restored only through simple manual steps (power cycle, reset). | Freezing, rebooting, and similar issues are acceptable, but there must be no hardware damage, and the system must be able to recover with a simple reset. |
| E 급 | During and after the interference, the function will be permanently disabled and cannot be restored without repairing or replacing the hardware. | Permanent damage; automatically deemed a failure |
Core Principle: If the DUT exhibits a Grade E performance (hardware damage, permanent loss of functionality), the test is deemed a failure regardless of the agreed-upon grade; for Grades A through D, pass/fail is determined based on the minimum acceptable grade agreed upon by the supplier and the customer.
5.2.4 사후 테스트 절차
장비와 DUT(테스트 대상 장치) 모두 전원이 꺼져 있는지 확인하십시오. 먼저 DUT 쪽 배선을 분리한 다음 장비 쪽 배선을 분리하십시오.
6. 장비의 일상 유지보수 및 관리
6.1 매일 청소
6.1.1 청소 일정 및 절차
사용 후터치스크린 표면을 청소하고 기기 패널의 먼지를 제거하십시오.
매주: Clean the equipment housing and the filters in the vents;
월간 회원장비 내부의 먼지를 청소하십시오(전문가가 수행해야 함).
6.1.2 청소 방법
Wipe the exterior with a clean, soft, lint-free cloth; use a dedicated screen cleaner for the touchscreen; clean the vents with a soft-bristled brush and use a vacuum cleaner if necessary; do not use corrosive solvents such as acetone.
6.2 정기점검
Check the power cord for damage or wear; check that the ground connection is secure; check that the fan is operating normally; check that the buttons and touchscreen are responsive; check the terminal blocks for oxidation or loose connections.
6.3 보관 및 취급
6.3.1 장기 보관 요건
Storage Conditions: Temperature -10°C to +50°C, humidity ≤ 85%; Clean the equipment and apply dust protection before storage; Power it on once every 3 months, running it for at least 30 minutes each time; Avoid stacking or applying heavy pressure to prevent the panel from warping.
6.3.2 취급 시 주의사항
Unplug all external cables before moving the device; use the original packaging and ensure it is properly cushioned and protected; keep the device upright during transport and avoid harsh vibrations; when lifting, grip the bottom and sides of the device—do not lift by the panel.
6.4 교정 간격 요구 사항
측정 정확도와 장비의 작동 신뢰성을 보장하기 위해, 자격을 갖춘 제3자 계측 연구소에 정기적으로 보내 교정을 받는 것이 좋습니다. 권장 교정 주기는 12개월입니다. 사용자는 사용 빈도, 환경 조건 및 품질 시스템 요구 사항을 고려하여 구체적인 교정 주기를 결정할 수 있습니다.
7. 문제 해결 및 일반적인 문제 해결 방법
| 결함 증상 | 가능한 원인들 | 순서 |
|---|---|---|
| 기기가 켜지지 않습니다 | The input power supply main power switch on the back is not turned on, or the fuse has blown | Turn on the input power supply switch located at the power cord receptacle on the back of the unit; check the fuse, and if it has blown, replace it with a fuse of the same rating. |
| 전원을 켠 후 터치스크린 오작동 | 시스템 멈춤, 리본 케이블 느슨함 | If the problem persists after restarting, disconnect the power, remove the device’s outer casing, and check whether the touchscreen ribbon cable is loose. |
| Test Stopped Automatically Midway | Over-temperature protection triggered, overcurrent/overvoltage protection triggered | Check whether the equipment’s ventilation is obstructed and whether the ambient temperature is too high; check the DUT for short circuits or overloads. |
| USB Flash Drive Not Recognized | USB drive format is incompatible or has excessive capacity | Use a FAT32-formatted USB drive with a capacity of no more than 32 GB; if that doesn’t work, try a different USB drive. |
| No voltage/current after output is enabled | DUT Wiring Abnormality, Protection Function Triggered | After disconnecting the output, verify that the DUT is wired correctly and that there are no open circuits or short circuits; check for any overvoltage, overcurrent, or overtemperature warnings, and retry after resolving the issue. |
| Abnormal Output Voltage/Current Accuracy | Improper output resistance settings; long-term lack of calibration | Verify that the source impedance parameters meet the test requirements; contact a third-party metrology organization to perform calibration. |

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